Boin GmbH
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Scan day: 09 February 2014 UTC
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Description: Suppliers of software tools for IC and wafer manufacturers. Provides ability to read, analyze and visualize semiconductor metrology data.
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Contact Information
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WEBSITE Info
| Page title: | |
| Keywords: | wafermap, panelmap, semiconductor, software, metrology, equipment, IC, LCD, TFT, solar, panel, wafer, wafermap-view.ocx, waferview.ocx, 1D Plot, line scan, 2D Contour Plot, 2D Color Plot, value plot, 3D Color Plot, 3D bar chart, sigma range plot, statistical analysis, histogram, standard deviation, Import data from metrology tools, F4 Dimensions, AMS SRD/MRD, AIT CMT 5000, CDE ResMap, FILMetrics, KLA Tencor RS 100, KLA Tencor F5 Ellipsometer, NanoPhotonics, Napson WS300, Nicolet, OMT, Plasmos, Prometrix Rs, Prometrix UV-1250, QC Solutions, Rigaku, Rudolph, Rudolph Metapulse, SOPRA SE, Semitek, Thermawave Optiprobe and Thermaprobe, TWIN, E & H, Foothill, Jenoptik, ISIS optronics, Sigmatech, Tepla, OPUS, circular, Cartesian, test diameter, SPC, Trend charts, All points, all wafers, Stacked Maps, Sigma Sorting Filter, Interpolation, DCOM (ActiveX server), DDE linking |
| Description: | Metrology software for the semiconductor industry. Download the evaluation copy of WAFERMAP or PANELMAP. Read, analyze and visualize data files from semiconductor metrology equipment. |
| IP-address: | 80.237.133.62 |
WHOIS Info
| NS | Name Server: B1.WPNS.HOSTEUROPE.DE Name Server: B1.WSNS.HOSTEUROPE.DE |
| WHOIS | Status: clientDeleteProhibited Status: clientTransferProhibited Status: clientUpdateProhibited |
| Date | Creation Date: 26-may-1998 Expiration Date: 25-may-2014 |