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International Reliabilitiy Physics Symposium

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Scan day: 03 February 2014 UTC
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Description: Annual conference. Includes information on posters and papers, presenter information and program.
          For 52 years, IRPS has been the premier conference for engineers and scientists to present new and original work in the area of microelectronics reliability. Drawing participants from the United States, Europe, Asia, and all other parts of the world, IRPS seeks to understand the reliability of semiconductor devices, integrated circuits, and microelectronic assemblies through an improved understanding of both the physics of failure as well as the application environment.
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Page title:IRPS 2014
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Description:The International Reliability Physics Symposium is the premiere conference for engineers and scientists to present new and original work in the area of microelectronics reliability.
IP-address:216.194.248.60