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Oxford Microbeams Ltd.

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Scan day: 18 February 2014 UTC
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Description: Non-destructive, trace elemental analysis, ion beam analysis using a focused microbeam. Includes applications in tomography and microfabrication, downloads and contacts in England.
NEW!!!    OMDAQ 2007, the Windows XP / PCI ugrade of OMDAQ, is now available Set up in 1986, with over fifteen years experience in the field, is a leader in the design and manufacture of specialist equipment for high energy ion microbeams.
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Page title:Oxford Microbeams Ltd.
Keywords:Nuclear Microanalysis, Scanning Proton Microprobe, Scanning Nuclear Microprobe, Elemental Microanalysis, Ion Beam Analysis, Scanning, Microbeam, Focusing, Focussing, Trace Sensitivity, Non-destructive, State-of-the-art,
Description:The ultimate solution to your microanalytical problem! Non-destructive, trace elemental analysis: Ion Beam Analysis using a focussed microbeam
IP-address:195.102.60.14