Oxford Microbeams Ltd.
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Scan day: 18 February 2014 UTC
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Description: Non-destructive, trace elemental analysis, ion beam analysis using a focused microbeam. Includes applications in tomography and microfabrication, downloads and contacts in England.
NEW!!! OMDAQ 2007, the Windows XP / PCI ugrade of OMDAQ, is now available Set up in 1986, with over fifteen years experience in the field, is a leader in the design and manufacture of specialist equipment for high energy ion microbeams.
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Page title: | Oxford Microbeams Ltd. |
Keywords: | Nuclear Microanalysis, Scanning Proton Microprobe, Scanning Nuclear Microprobe, Elemental Microanalysis, Ion Beam Analysis, Scanning, Microbeam, Focusing, Focussing, Trace Sensitivity, Non-destructive, State-of-the-art, |
Description: | The ultimate solution to your microanalytical problem! Non-destructive, trace elemental analysis: Ion Beam Analysis using a focussed microbeam |
IP-address: | 195.102.60.14 |