Scientific Computing International SCI
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Description: Software for optical thin film design, characterization and metrology systems. Current products include: Film Wizard, Film Spectrum and Film Ellipse.
Scientific Computing International - Raising Thin Film Metrology to a New Level. SCI offers metrology systems for thin-film material characterization, with models that range from table-top systems suitable for R&D to fully automated, standalone production tools, and software products for thin-film analysis and design
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| Page title: | Scientific Computing International - Raising Thin Film Metrology to a New Level. SCI offers metrology systems for thin-film material characterization, with models that range from table-top systems suitable for R&D to fully automated, standalone production tools, and software products for thin-film analysis and design |
| Keywords: | Scientific Computing International, SCI, film thickness, thin film, thin film thickness, film thickness measurement, metrology, metrology tools, thin film metrology, thin film metrology tools, ellipsometry, ellipsometer, ellipsometers, spectroscopic ellipsometry, spectroscopic ellipsometer, SE, multiwavelength ellipsometer, reflectometry, reflectometer, reflectometers, spectroscopic reflectometry, spectroscopic reflectometer, multi angle reflectometer, material characterization, optical properties, SCI, Scientific Computing International, thickness, index, index of refraction, extinction coefficient, material analysis, roughness, crystallinity, spectrophotometry, spectrophotometer, duv spectroscopic ellipsometer, NIR spectroscopic ellipsometer, dispersion, film software, optical design, low k, porous silicon, polysilicon, si, transmission, reflection, n and k, optical coatings, optical characterization, optical spectroscopy, spectrograph, spectrometers, thin film software, optical design software, material analysis software, ellipsometry software, optical monitor software, optical properties, retardance, birefringence |
| Description: | Scientific Computing International (SCI) provides high resolution thin film metrology tools and analysis software products to leading companies in the semiconductor, optoelectronics, display, MEMS, data storage, and optical coating industries. SCI also provides software for optical thin film design and material analysis including FilmWizard, an optical thin film design and material analysis program, and FilmEllipse, an analysis and acquisition tool that can be used with any ellipsometer. (Ellipsometer, reflectometer, polarimeter, reflection, transmission, ellipsometry, duv spectroscopic ellipsometer, NIR spectroscopic ellipsometer, spectrophotometer, spectroscopic ellipsometer, film thickness, index of refraction, optical constants, index, thickness, extinction coefficient, birefringence, energy band gap, surface roughness, crystallinity, film properties versus temperature, multilayer thicknesses, integrated metrology modules, semiconductor, III-V compound semiconductor, optoelectronics, optics, photonics, data storage, display, micro electromechanical system (MEMS), nanotechnology, and optical coating industries) |
| IP-address: | 207.57.8.250 |
WHOIS Info
| NS | Name Server: NS.NAMESERVERS.NET Name Server: NS2.NAMESERVERS.NET |
| WHOIS | Status: ok |
| Date | Creation Date: 04-nov-1996 Expiration Date: 03-nov-2015 |