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Jandel Engineering

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Scan day: 09 February 2014 UTC
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Description: Manufacture probes for resistivity test measurement of semiconductors, silicon wafers and thin metal films. Based in Leighton Buzzard, UK.
Jandel Engineering Four Point Probes Resistivity Measurement Equipment including Four Point Probes Jandel General Purpose Four Point Probe System The general purpose system can be used for wafers, ingots, TCOs, thin metal layers and much more!
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Page title:Jandel Engineering Four Point Probes
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IP-address:85.233.160.70