ThetaMetrisis
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Scan day: 09 February 2014 UTC
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Description: Manufacturer of optical metrology tools for the characterization of thin and thick films (film thickness, refractive index and extinction coefficient), using white light reflectance spectroscopy.
 See us at Photonics West 2014, Stand-3082 This email address is being protected from spambots. You need JavaScript enabled to view it. "My research group has been using “FR-Basic†the last four months to measure the thickness of zeolite films that we synthesize on top of Metglas ribbons. The quick and accurate measurement of the thickness of our films is very essential for our research. “FR-Basic†is very user-friendly and provide reliable results. The sales support personnel were very friendly and the delivery times were fast and as agreed. I highly recommend the instrument to other research groups"
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WEBSITE Info
| Page title: | Home |
| Keywords: | Film Thickness, Refractive Index, Absorbance, Transmittance, Fluorescence, Haze, Gloss, Chemical Sensors, Bioreactions Monitoring, Polymer Physiochemical Properties, Sensor, WLRS, SWI, White Light Reflectance Spectroscopy, Single Wavelength Interferometry, Optical measurements |
| Description: | Film Metrology |
| IP-address: | 204.93.163.79 |
WHOIS Info
| NS | Name Server: NS1.WEBHOSTINGPAD.COM Name Server: NS2.WEBHOSTINGPAD.COM |
| WHOIS | Status: clientTransferProhibited |
| Date | Creation Date: 17-apr-2008 Expiration Date: 17-apr-2014 |