Omniscan
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Scan day: 18 February 2014 UTC
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Description: Provides instrumentation and consulting for measurement of surface roughness, waviness and shape; layer thickness and optical properties ranging from the sub-nanometer to the cm scales.
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WEBSITE Info
| Page title: | Omniscan - Innovative Measurement Solutions |
| Keywords: | non-contact surface metrology, 3D profiling, Fizeau, interferometers, stylus, profilometer, afm, spm, atomic force microscopy, scanning probe, nanotechnology, nano, microscopes, nanotech, nanoscience |
| Description: | |
| IP-address: | 82.165.103.141 |