J. A. Woollam Co., Inc.
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Description: Spectroscopic ellipsometers for thin film and bulk materials chacterization. Measures thin film thickness and material optical constants. In-situ and ex-situ, spectral ranges from Vacuum UV to Far IR.
Spectroscopic Ellipsometers - J.A. Woollam Co. The J. A. Woollam Co. manufacturers Spectroscopic Ellipsometers for non-destructive thin film and bulk material characterization. We have six types of spectroscopic ellipsometers to fit a wide variety of applications. Search within our product lines to find the best fit for your application. Choose from
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Phone&Fax: 402.477.7501
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WEBSITE Info
| Page title: | Spectroscopic Ellipsometers - J.A. Woollam Co. |
| Keywords: | ellipsometer applications, ellipsometer, ellipsometry, spectroscopic ellipsometer, SE, multiwavelength ellipsometer, insitu, J. A. Woollam,compensator ellipsometer, CompleteEASE, WVASE32, optical properties, thin film thickness, optical constants, index of refraction |
| Description: | J.A. Woollam develops spectroscopic ellipsometer technology used for thin film and bulk materials characterization. Measures thin film thickness and material optical constants. In-situ and ex-situ, spectral ranges from Vacuum UV to Far IR. |
| IP-address: | 204.27.195.128 |
WHOIS Info
| NS | Name Server: NS41.DOMAINCONTROL.COM Name Server: NS42.DOMAINCONTROL.COM |
| WHOIS | Status: clientDeleteProhibited Status: clientRenewProhibited Status: clientTransferProhibited Status: clientUpdateProhibited |
| Date | Creation Date: 02-jan-1997 Expiration Date: 21-nov-2023 |