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FEI Company

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Scan day: 18 February 2014 UTC
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Description: Supplier of charged particle beam instruments, including FIB systems, DualBeam systems, scanning and transmission electron microscopes, and components.
FEI | High-performance Microscopy Workflow Solutions
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Contact Information

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WEBSITE Info

Page title:FEI | High-performance Microscopy Workflow Solutions
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Description:FEI' s innovative microscopy and application expertise helps customers find meaningful answers to questions that accelerate breakthrough discoveries, increase productivity, and ultimately change the world.
IP-address:216.151.6.61

WHOIS Info

NS
Name Server: NS1.TWTELECOM.NET
Name Server: NS2.TWTELECOM.NET
WHOIS
Status: clientTransferProhibited
Date
Creation Date: 10-feb-1994
Expiration Date: 11-feb-2019