ION-TOF GmbH

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Description: Manufacturer of time-of-flight secondary ion mass spectrometers (TOF-SIMS) for surface analysis.

IONTOF.COM INNOVATIVE SURFACE ANALYSIS

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Page title:	IONTOF.COM INNOVATIVE SURFACE ANALYSIS
Keywords:	IONTOF, ION-TOF, TOF-SIMS, SIMS, SURFACE-ANALYSIS, TIME-OF-FLIGHT, SECONDARY-ION-MASS-SPECTROMETRY, SURFACE-SPECTROSCOPY, SURFACE-IMAGING DEPTH-PROFILING, 3D-ANALYSIS, THIN-FILM-ANALYSIS, MIRCO-ANALYSIS, INTERFACE-ANALYSIS, ANALYTICAL-INSTRUMENTS, SIENTIFIC-INSTRUMENTS, CHEMICAL-MAPPING, CLUSTER-SOURCES, OBERFLÄCHENANALYTIK, FLUGZEITMASSENSPEKTROMETRIE, TIEFENPROFILIERUNG, SEKUNDÄRIONENMASSENSPEKTROMETRIE, ION, TOF, SURFACE, ANALYSIS, TIME, OF, FLIGHT, SECONDARY, MASS, SPECTROMETRY, SURFACE, IMAGING, DEPTH, PROFILING, 3D, THIN, FILM, ANALYSIS, MIRCO, INTERFACE, ANALYTICAL, INSTRUMENTS, SIENTIFIC, CHEMICAL, MAPPING, CLUSTER, SOURCES
Description:	IONTOF ION-TOF TOF-SIMS SIMS SURFACE-ANALYSIS TIME-OF-FLIGHT SECONDARY-ION-MASS-SPECTROMETRY SURFACE-SPECTROSCOPY SURFACE-IMAGING DEPTH-PROFILING 3D-ANALYSIS THIN-FILM-ANALYSIS MIRCO-ANALYSIS
IP-address:	80.67.25.201

NS	Name Server: NS1.NICOS-AG.COM Name Server: NS2.DNS-SERVICE.NET
WHOIS	Status: clientTransferProhibited
Date	Creation Date: 07-dec-1998 Expiration Date: 06-dec-2014