Yield and Reliability of VLSI Circuits
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Description: Researching yield models and their verification, yield analysis and estimation techniques, yield enhancement schemes, and reliability and parametric yield.
Yield and Reliability of VLSI Circuits Formely supported by NSF, CISE: Design Automation Program, and by CISM (Center for Integrated Space Microsystems) at JPL, that were involved in this project presented at the Yield Optimization and Test (YOT'01) Workshop, Nov. 2001.
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| Page title: | Yield and Reliability of VLSI Circuits |
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