Ing.-Buero Thomas Fuchs
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Scan day: 02 February 2014 UTC
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Description: Manufactures measurement technology for photodiode array spectroscopy, specializing in film thickness measurement and plasma emission monitoring for process measurement and control tasks. Based in Germany.
Engineer's Office for Applied Spectroscopy - Film Thickness Gauges, PDA Spectrometer, Plasma Monitoring Engineer's Office for Applied Spectroscopy supplies high-end measurement technology for the photodiode array spectroscopy. We specialize in film thickness measurement and plasma emission monitoring for in-line and process controlling. Based on our experience of almost 25 years we offer customized solutions world-wide!
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WEBSITE Info
| Page title: | Engineer's Office for Applied Spectroscopy - Film Thickness Gauges, PDA Spectrometer, Plasma Monitoring |
| Keywords: | film thickness measurement,film thickness gauge,film thickness gage,thickness measurement,thickness gauge,thickness gage,thin film measurement,thin film gauge,thin film gage,interference,reflectometry,white-light,white light,coating thickness,web coating,web coater,diode array,photodiode,photodiode array,spectrometer,photometer,spectroscopy,spectrometry,plasma emission,plasma control,emission,emission control,chamber,sputter,plasma,vacuum,PVD,PEVD,UV,VIS,NIR,Parylene |
| Description: | We offer gauges for the photodiode array spectroscopy, film thickness measurement and plasma emission monitoring, especially for in-line measurement tasks. |
| IP-address: | 80.237.132.171 |
WHOIS Info
| NS | Name Server: NS1.HANS.HOSTEUROPE.DE Name Server: NS2.HANS.HOSTEUROPE.DE |
| WHOIS | Status: clientDeleteProhibited Status: clientTransferProhibited Status: clientUpdateProhibited |
| Date | Creation Date: 17-jan-1998 Expiration Date: 16-jan-2015 |