Scientific Computing International
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Scan day: 02 February 2014 UTC
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Description: Provides thin film metrology systems, thin film design software, and material characterization tools to the semiconductor and optical coating industries.
FilmTek™ Thin Film Measurement Systems: Spectroscopic Ellipsometers, Reflectometers, Multiple Angle Reflectometers, and Generalized Ellipsometry for Optical CD Measurement Metrology Products: Spectroscopic Ellipsometers, Reflectometers, Multiple Angle Reflectometers, and Generalized Ellipsometry for Optical CD Measurement
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Contact Information
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WEBSITE Info
| Page title: | FilmTek™ Thin Film Measurement Systems: Spectroscopic Ellipsometers, Reflectometers, Multiple Angle Reflectometers, and Generalized Ellipsometry for Optical CD Measurement |
| Keywords: | optical CD, film thickness, thin film measurement, film thickness measurement, metrology, ellipsometry, ellipsometer, ellipsometers, spectroscopic ellipsometry, spectroscopic ellipsometer, SE, generalized ellipsometry, reflectometry, reflectometer, reflectometers, spectroscopic reflectometry, spectroscopic reflectometer, multi angle reflectometer, material characterization, thickness, index, refractive index, extinction coefficient, surface roughness, spectrophotometry, duv spectroscopic ellipsometer, NIR spectroscopic ellipsometer, low k, silicon, transmission, reflection, n and k, optical characterization, optical , optical properties, retardance, birefringence |
| Description: | FilmTek™ spectroscopic ellipsometers, reflectometers, multiple angle reflectometers, and generalized ellipsometry for thin film characterization and optical CD measurement |
| IP-address: | 207.57.8.250 |
WHOIS Info
| NS | Name Server: NS.NAMESERVERS.NET Name Server: NS2.NAMESERVERS.NET |
| WHOIS | Status: ok |
| Date | Creation Date: 04-nov-1996 Expiration Date: 03-nov-2015 |