Spectel Research Corporation
Edit Page
Report
Scan day: 12 February 2014 UTC
5
Virus safety - good
Description: Develops and makes semiconductor metrology products.
Spectel Company - Measurement; modeling; simulation; optimization; optical and SEM instruments; software for semiconductor metrology. Spectel was formed in 1990 as a research and development company for advancing the state of technology in semiconductor instrumentation and fabrication.
Size: 286 chars
Contact Information
Email: —
Phone&Fax: —
Address: —
Extended: —
WEBSITE Info
| Page title: | Spectel Company - Measurement; modeling; simulation; optimization; optical and SEM instruments; software for semiconductor metrology. |
| Keywords: | Metrology, Scatterometry, optics, microscope, grating, film thickness, film stack, measurement, astigmatism, resolution, photomask, reticle, MEM, aerial, Semcionductor, Metrology, electron, optical, modeling, simulation, scanning, SEM, IC, characterization |
| Description: | Measurement; modeling; simulation; optimization; optical and SEM instruments; software for semiconductor metrology. |
| IP-address: | 192.220.99.241 |
WHOIS Info
| NS | Name Server: NS1.SECURE.NET Name Server: NS2.SECURE.NET |
| WHOIS | Status: clientTransferProhibited |
| Date | Creation Date: 19-jul-2001 Expiration Date: 19-jul-2014 |