Foothill Instruments, LLC
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Scan day: 12 February 2014 UTC
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Description: Manufacturer of film thickness metrology equipment for semiconductor and related industries.
Foothill Instruments manufactures metrology systems for semiconductor, MEMS, optical, and related markets. Our film thickness products are capable of measuring up to 500 microns of dielectric. Our wafer thickness products measure thinned silicon and very thick dielectrics.
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Contact Information
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WEBSITE Info
| Page title: | Foothill Instruments |
| Keywords: | film thickness, metrology, measurement, instrument, thin film, thick film, wafer thinning, backgrind, refractive index, ellipsometry, interferometry, reflectivity, spectrometer, oxide, photoresist, resist, uniformity, polymer, nitride, oxynitride, polyimide, BCB, SU-8, spin-on, low-k, a-silcon, polysilicon, amorphous silicon, dielectric, silicon, silicide, GaAs, mapping, wafer, semiconductor, plating, electroplating, advanced packaging, epitaxy, MEMS, magnetic disk, micromachining, flat panel display |
| Description: | Foothill Instruments manufactures wafer and film thickness metrology systems. |
| IP-address: | 116.251.205.68 |
WHOIS Info
| NS | Name Server: NS1.STATION183.COM Name Server: NS2.STATION183.COM |
| WHOIS | Status: clientDeleteProhibited Status: clientTransferProhibited |
| Date | Creation Date: 12-mar-1999 Expiration Date: 12-mar-2015 |