Scan day: 02 February 2014 UTC
Virus safety - good
Description: Electron Flight Simulator lets you model beam/specimen interactions in the scanning (SEM) or transmission (TEM) electron microscope. Designed to improve X-ray microanalysis results.
Announcement: electron microscope software and perfomance & calibration standards for x-ray microanalysis on the SEM and TEM Whether you work with micro or nanotechnology, o ur products are designed to help make x-ray analysis easier.
Size: 228 chars
Total pages in the index, 13